Hardware-independent configuration for a SysId test routine.
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#include <frc2/command/sysid/SysIdRoutine.h>
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| Config (std::optional< ramp_rate_t > rampRate, std::optional< units::volt_t > stepVoltage, std::optional< units::second_t > timeout, std::optional< std::function< void(frc::sysid::State)> > recordState) |
| Create a new configuration for a SysId test routine. More...
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Hardware-independent configuration for a SysId test routine.
◆ Config()
frc2::sysid::Config::Config |
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std::optional< ramp_rate_t > |
rampRate, |
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std::optional< units::volt_t > |
stepVoltage, |
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std::optional< units::second_t > |
timeout, |
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std::optional< std::function< void(frc::sysid::State)> > |
recordState |
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Create a new configuration for a SysId test routine.
- Parameters
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rampRate | The voltage ramp rate used for quasistatic test routines. Defaults to 1 volt per second if left null. |
stepVoltage | The step voltage output used for dynamic test routines. Defaults to 7 volts if left null. |
timeout | Safety timeout for the test routine commands. Defaults to 10 seconds if left null. |
recordState | Optional handle for recording test state in a third-party logging solution. If provided, the test routine state will be passed to this callback instead of logged in WPILog. |
◆ m_rampRate
ramp_rate_t frc2::sysid::Config::m_rampRate {1_V / 1_s} |
The voltage ramp rate used for quasistatic test routines.
◆ m_recordState
Optional handle for recording test state in a third-party logging solution.
◆ m_stepVoltage
units::volt_t frc2::sysid::Config::m_stepVoltage {7_V} |
The step voltage output used for dynamic test routines.
◆ m_timeout
units::second_t frc2::sysid::Config::m_timeout {10_s} |
Safety timeout for the test routine commands.
The documentation for this class was generated from the following file: