Hardware-independent configuration for a SysId test routine.
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#include <wpi/commands2/sysid/SysIdRoutine.hpp>
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| ramp_rate_t | rampRate {1_V / 1_s} |
| | The voltage ramp rate used for quasistatic test routines.
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| wpi::units::volt_t | stepVoltage {7_V} |
| | The step voltage output used for dynamic test routines.
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| wpi::units::second_t | timeout {10_s} |
| | Safety timeout for the test routine commands.
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| std::function< void(wpi::sysid::State)> | recordState |
| | Optional handle for recording test state in a third-party logging solution.
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Hardware-independent configuration for a SysId test routine.
◆ Config()
| wpi::cmd::sysid::Config::Config |
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std::optional< ramp_rate_t > | rampRate, |
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std::optional< wpi::units::volt_t > | stepVoltage, |
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std::optional< wpi::units::second_t > | timeout, |
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std::function< void(wpi::sysid::State)> | recordState ) |
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inline |
Create a new configuration for a SysId test routine.
- Parameters
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| rampRate | The voltage ramp rate used for quasistatic test routines. Defaults to 1 volt per second if left null. |
| stepVoltage | The step voltage output used for dynamic test routines. Defaults to 7 volts if left null. |
| timeout | Safety timeout for the test routine commands. Defaults to 10 seconds if left null. |
| recordState | Optional handle for recording test state in a third-party logging solution. If provided, the test routine state will be passed to this callback instead of logged in WPILog. |
◆ rampRate
| ramp_rate_t wpi::cmd::sysid::Config::rampRate {1_V / 1_s} |
The voltage ramp rate used for quasistatic test routines.
◆ recordState
Optional handle for recording test state in a third-party logging solution.
◆ stepVoltage
| wpi::units::volt_t wpi::cmd::sysid::Config::stepVoltage {7_V} |
The step voltage output used for dynamic test routines.
◆ timeout
| wpi::units::second_t wpi::cmd::sysid::Config::timeout {10_s} |
Safety timeout for the test routine commands.
The documentation for this class was generated from the following file: